TrueDimensions

• Ultimate Precision
• Ultimate Performance
• Ultimate Flexibility
• Contact
• Our Products
• Precise
• Durable
• Search

Sitemap

• Topmenu
  • Tip Handling
  • Reseller
  • Blog
  • Home
• Products
  • Blue Line
    • Extreme Aspect Ratio
      • EBD6-400A
      • EBD2-100A
      • EBD3D2-100A
      • EBD8-600A
      • EBD4-200A
    • High Aspect Ratio
      • M1-HAR
      • M1-ESD
      • M-CIS
      • MC90/70
    • MCNT
      • MCNT-300
      • MCNT-100
      • MCNT-500
      • MCNT-400
      • MCNT-150
      • MCNT-100 Park AAFM
      • MCNT-150 Park AAFM
      • MCNT-500 12 deg
    • Enhanced Resolution
      • SSE
      • SSE-soft
    • Fast Scanning
      • QUANTUM-PRO
      • QUANTUM-UHF
    • 3D CD Metrology
      • CDR40-EBD
      • CDR50-EBD
      • CDR30-EBD
      • CDR20-EBD
      • CDR15-EBD
      • CDR70-EBD
      • CDR130-EBD
    • EBD-TESPA Probes
      • EBD-RTESPA
      • EBD-FESPA
  • Green Line
    • High Resolution AFM
      • aCNT-NCH
      • aCNT-FM
      • SSS-NCHR
      • SSS-FMR
      • EBD-NCH
      • EBD-HAR
      • EBD-AR15T
      • EBD-AR20T
      • EBD-FMR
    • Lifescience
      • biotool cell XXL
      • biotool cell
      • biotool high res
    • NanoIndentation
      • biosphere™ -Au reflex
  • White Line
    • Customised solutions
    • nanoMEMS
• blog
  • TrueDimensions
  • HDC-20
  • EBD6-400 product flyer
  • SPIE Advanced Lithography 2015
  • ISO 9001 Certificate
  • CDR50-EBD
  • B20-NanoIndentation
  • SPIE Proceedings Paper
  • CD AFM Tips in Semiconductor Industry
  • M-CNT-500 product flyer
  • CDR50-EBD product flyer
  • HDC Fine Features product flyer
  • NanoIndentation product flyer
  • Tip characterization method for CD-AFM
  • SPIE Advanced Lithography 2016
  • Ultra-high-resolution magnetic force microscopy
  • SPIE Smart Structures NDE 2016
  • CD characterization of EUV photomask structures
  • Stress measurements of planar dielectric elastomer actuators
  • Quantum Series: Consistency in Fast Scanning
  • Atomic Resolution Quality Control for Fin Oxide Recess
  • High-resolution imaging of polyacrylonitrile-based fibers
  • Mechanical properties of nanometer-thin polymer films
  • In focus: Atomic resolution Fin FET metrology
  • AFM monitoring of template fill in graphoepitaxy DSA
  • Customer Notification: Packaging Improvement
  • Structural characteristics of forisome aggregates
  • Advanced Semiconductor Manufacturing Conference 2017
  • Topology and mechanics of heterotypic collagen fibrils
  • Investigating the stiffness of sputtered Au on PDMS
  • AFM-based force volume analysis of open cylindrical micellar filaments
  • Int'l Conference on Planarization/CMP Technology 2017
  • biosphere: The Series for Quantitative Nanomechanical Studies
  • Novel hydrogel for potential soft tissue engineering applications
  • biotool cell XXL: 15 um long probe for live cell AFM imaging
  • Local optical response of AFM tips using scanning hyperspectral imaging, relevance for TERS applications
  • biotool high-res: hydrophobic 2 nm apex and soft cantilever for non-destructive measurements
  • MCNT-500: Workhorse of more than 10 years in semi fab metrology now available with 12 deg tilt compensation
  • EBD-RTESPA: The Diamond-Like Carbon Tapping Engage Probe
  • Build-A-Probe: Personalized AFM Tips - Manufactured On-Demand
  • Hagfish fiber intermediate filaments (IFs) reconstituted into functional biomimetic materials
  • TrueDimensions: Specs Verified ... For Every Probe
  • Reconstituting membrane-embedded NPC mimics for biotechnological applications
  • Connecting with partners and peers at the SEMICON WEST
  • Studying elastic properties of bone tissue in the adult mouse femur through AFM indentation
• static
  • Durable
  • search
  • Precise
  • Sitemap
  • Imprint
  • Contact
  • truedimensions
  • nobox
  • nobox_1
  • nobox_3
  • nobox_2