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- Tip characterization method for CD-AFM
- SPIE Advanced Lithography 2016
- Ultra-high-resolution magnetic force microscopy
- SPIE Smart Structures NDE 2016
- CD characterization of EUV photomask structures
- Stress measurements of planar dielectric elastomer actuators
- Quantum Series: Consistency in Fast Scanning
- Atomic Resolution Quality Control for Fin Oxide Recess
- High-resolution imaging of polyacrylonitrile-based fibers
- Mechanical properties of nanometer-thin polymer films
- In focus: Atomic resolution Fin FET metrology
- AFM monitoring of template fill in graphoepitaxy DSA
- Customer Notification: Packaging Improvement
- Structural characteristics of forisome aggregates
- Advanced Semiconductor Manufacturing Conference 2017
- Topology and mechanics of heterotypic collagen fibrils
- Investigating the stiffness of sputtered Au on PDMS
- AFM-based force volume analysis of open cylindrical micellar filaments
- Int'l Conference on Planarization/CMP Technology 2017
- biosphere: The Series for Quantitative Nanomechanical Studies
- Novel hydrogel for potential soft tissue engineering applications
- biotool cell XXL: 15 um long probe for live cell AFM imaging
- Local optical response of AFM tips using scanning hyperspectral imaging, relevance for TERS applications
- biotool high-res: hydrophobic 2 nm apex and soft cantilever for non-destructive measurements
- MCNT-500: Workhorse of more than 10 years in semi fab metrology now available with 12 deg tilt compensation
- EBD-RTESPA: The Diamond-Like Carbon Tapping Engage Probe
- Build-A-Probe: Personalized AFM Tips - Manufactured On-Demand
- Hagfish fiber intermediate filaments (IFs) reconstituted into functional biomimetic materials
- TrueDimensions: Specs Verified ... For Every Probe
- Reconstituting membrane-embedded NPC mimics for biotechnological applications
- Connecting with partners and peers at the SEMICON WEST
- Studying elastic properties of bone tissue in the adult mouse femur through AFM indentation
- Examining Cell Morphology and Cell Wall Stiffness Using AFM and Nano-Indentation
- Four-axes stage for low-noise AFM CD measurements
- Connecting with partners and peers at the SPIE Advanced Lithography
- Tailoring Elastic Modulus of PDMS Nano-Membranes for Bioelectronic Applications
- NIST scientists study CD-AFM tip lifetime and wear rate: impact on measurement variability and cost
- Studying nanomechanical properties of primary cell walls in the inner tissues of growing plant organs
- Comparing 5 topography sensors in a single set-up. How does AFM measure up?
- AFM Nanometrology Of Hard Sapphire Micro-bumps With Excellent Repeatability
- Engineering Mechanical Properties Of Metal-Organic Materials
- Large-Area Graphene Oxide Films for Supercapacitor Electrodes, Transparent Conductive Films and FET's
- EBD8-600A: Semi fab metrology workhorse for extreme HAR trench profiling
- Studying Plant Cell Wall Stiffness Gradients Using AFM Nano-Indentation
- biosphere: Now available with 5 micron radius
- Van der Waals heterojunctions create new platform for photovoltaic and photodetector design
- Influence of AFM Tip Radius when Measuring Mechanical Properties of Biomimetic Membranes
- Flat Tip Effectively Avoids Tip-derived Youngs Modulus Errors Introduced by Conventional Tips
- EBD-16: Semi Fab proven solution for extreme deep trench metrology
- Beetles Elytra, a model structure for next-generation bioinspired synthetic materials
- BOSCH and KIT Researchers Explore Tip Wear and Tip Shape Impact on Measurement Uncertainty During Thermal Grooving AFM Study
- German National Metrology Institute (PTB) Scientists Present Nanomechanical Head with Exchangeable AFM Probes As Indenter
- MCNT-300: 18nm cylindrical tip for durable and consistent bottom access of finest features
- QUANTUM-AC10: Extremely Low Wear for Super-Fast AFM's
- Studying Morphology, Actin Distribution and Stiffness Changes of Live Mature Epithelial Cells
- nanotools AFM probes available on NanoAndMore webstore
- German National Metrology Institute (PTB) Scientists study CD-AFM and TEM for reference EUV Photomask Metrology
- AFM with large and ultrasharp tips is used to explore arterial tissue stiffness at two scales
- Studying MOCVD deposition of MoTe2 thin films on 8-inch SiO2/Si substrates
- V-Groove and Rectangular Single Crystal Diamond Diffraction Gratings Characterized by SEM and AFM
- Metrology Super Sharp (MSS): Heavy-Duty Carbon Tips for Very Narrow HAR Trenches
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