Ultra-high-resolution magnetic force microscopy
Posted 16-05-02 09:11 | Permalink: www.nanotools.com/blog/ultra-high-resolution-magnetic-force-microscopy.html
Publication update:nanotools M-CNT tips featured in research article
Learn how nanotools M-CNTs are successfully applied to investigate the impact of probe-tip dimensions on resolution and contrast in magnetic force microscopy (MFM)
- Title: Demonstration of ultra-high-resolution MFM images using Co90Fe10-coated CNT probes, DOI: 10.1016/j.jmmm.2009.09.052
- Authors: Sang-Jun Choi, Ki-Hong Kim, Young-Jin Cho, Hu-san Lee, Samsung Electronics Co. Ltd. (Republic of Korea); Soo-haeng Cho, Yonsei University (Republic of Korea); Soon-Ju Kwon, POSTECH (Republic of Korea); Jung-hwan Moon, Kyung-Jin Lee, Korea University (Republic of Korea)
- Publication: Journal of Magnetism and Magnetic Materials
- Publisher: Elsevier B.V.
- Date: February 2010
Used with permission from Elsevier B.V. (LICENSE #: 3818181196341).
Copyright © 2016 Elsevier B.V. All rights reserved.

