Tip characterization method for CD-AFM

Posted 16-04-04 13:12 | Permalink: www.nanotools.com/blog/tip-characterization-method-for-cd-afm.html

Publication update:
nanotools AFM tips featured in research article

Discover a newly developed tip characterization method for CD-AFM by means of a multi-feature characterizer.

Title: Tip characterization method using multi-feature characterizer for CD-AFM, DOI: 10.1002/9781118723111
Authors: Ndubuisi G. Orji, NIST (United States), Hiroshi Itoh, Chumei Wang, AIST (Japan), Ronald G. Dixson, NIST (United States), Peter S. Walecki, Florida Atlantic University (United States), Sebastian W. Schmidt, Bernd Irmer, nanotools GmbH (Germany)
Publication: Ultramicroscopy
Publisher: Elsevier B.V.
Date: March 2016

back