Precise │ Durable │ Consistent
nanotools blog

Tip characterization method for CD-AFM

Posted 16-04-04 13:12 | Permalink:
Elsevier_Pub Publication update:
nanotools AFM tips featured in research article

Discover a newly developed tip characterization method for CD-AFM by means of a multi-feature characterizer.
Visit Science Direct® for details (external link)

Used with permission from Elsevier B.V. (LICENSE #: 3818181124835).
Copyright © 2016 Elsevier B.V. All rights reserved.