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NIST scientists study CD-AFM tip lifetime and wear rate: impact on measurement variability and cost

Posted 20-04-10 00:06 | Permalink:
Publication update:
nanotools CDR50-EBD probes used in study published by NIST researchers

Discover how the wear behavior of nanotools CDR50-EBD with controlled 50 nm diameter compare to that of standard CDR silicon probes.
Download paper from NIST website - Local Download (external link)

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