Capturing and Analyzing 2D-Materials' SEM and AFM Images on the Same Sample Location
Posted 22-10-31 22:21 | Permalink: www.nanotools.com/blog/capturing-and-analyzing-2d-materials-sem-and-afm-images-on-the-same-sample-location.html
Publication update:
nanotools EBD-HAR probes featured in research article
Discover how nanotools EBD-HAR is applied to measure height/width/roughness of MoTe2 rods, MoS2 film grains, and for indentation marking on PMMA layers.
- Title: Advanced Hybrid Positioning System of SEM and AFM for 2D Material Surface Metrology
DOI: 10.1017/S1431927622000903 - Authors: Jaeryong Kim, Donghwan Kim, TaeWan Kim, Hyunwoo Kim, ChaeHo Shin
- Publication: Microscopy and Microanalysis
- Publisher: Cambridge University Press
- Date: June 9, 2022
Copyright © The Author(s), 2022. Published by Cambridge University Press on behalf of the Microscopy Society of America
