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CDR50-EBD product flyer

Posted 15-10-29 17:52
CDR50-EBD Blue Line product flyer update:
CDR50-EBD – The industry standard for high-performance mask inspection and wafer process monitoring. Download CDR50-EBD product flyer

HDC Fine Features product flyer

Posted 15-09-25 15:14
HDC-Fine-Features Blue Line product flyer update:
HDC-40 / HDC-30 / HDC-20 – Supersharp high aspect ratio AFM tips optimized for enhanced access capabilities and consistent performance stability. Download HDC Fine Features product flyer

NanoIndentation product flyer

Posted 15-12-29 16:08
NanoIndentation Green Line product flyer update:
Spherical AFM tips for high performance nanoindentation measurements. Download NanoIndentation product flyer

Tip characterization method for CD-AFM

Posted 16-04-04 13:12
Elsevier_Pub Publication update:
nanotools AFM tips featured in research article

Discover a newly developed tip characterization method for CD-AFM by means of a multi-feature characterizer.
Visit Science Direct® for details (external link)

Used with permission from Elsevier B.V. (LICENSE #: 3818181124835).
Copyright © 2016 Elsevier B.V. All rights reserved.

SPIE Advanced Lithography 2016

Posted 16-02-22 11:15
SPIE_2016 Conference proceedings update:
M-CNT-150 for DSA depth measurements.

Learn how nanotools M-CNT-150 AFM tips contribute to characterize the "Influence of template fill in grapho-epitaxy DSA".
Visit the SPIE proceedings page for details (external link)

Copyright © 2016 by SPIE.

Ultra-high-resolution magnetic force microscopy

Posted 16-05-02 09:11
Elsevier_Pub Publication update:
nanotools M-CNT tips featured in research article

Learn how nanotools M-CNTs are successfully applied to investigate the impact of probe-tip dimensions on resolution and contrast in magnetic force microscopy (MFM)
Visit Science Direct® for details (external link)

Used with permission from Elsevier B.V. (LICENSE #: 3818181196341).
Copyright © 2016 Elsevier B.V. All rights reserved.

SPIE Smart Structures NDE 2016

Posted 16-03-22 10:19
SPIE_NDE-2016 Conference proceedings update:
B500 applied for the characterization of dielectric elastomer actuators.

Learn how spherical B500 AFM tips contribute to characterize the "Morphology and conductivity of Au electrodes on polydimethylsiloxane using (3-mercaptopropyl)trimethoxysilane (MPTMS) as an adhesion promoter".
Visit the SPIE proceedings page for details (external link)

Copyright © 2016 by SPIE.

CD characterization of EUV photomask structures

Posted 16-05-27 10:20
IOP_Pub Publication update:
nanotools CDR-EBD tips featured in research article

Experience how nanotools diamond-like carbon CDR-EBD tips positively impact the long-term measurement stability of CD-AFM measurements
Visit IOPScience® for details (external link)

Used with permission from IOP Publishing Ltd.
Copyright © 2014 IOP Publishing Ltd. All rights reserved. This is an author-created, un-copyedited version of an article accepted for publication/published in Measurement Science and Technology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at 10.1088/0957-0233/25/4/044002

Stress measurements of planar dielectric elastomer actuators

Posted 16-08-01 08:40
RevSciInt_Pub Publication update:
nanotools spherical AFM tips featured in research article

Learn how precisely shaped full carbon AFM tips with 500 nm radius help to gain reliable information about the mechanical properties of DEA structures
Visit AIP Publishing for details (external link)

Used with permission from AIP Publishing LLC
Copyright © 2016 AIP Publishing LLC. All rights reserved.

Quantum Series: Consistency in Fast Scanning

Posted 16-09-19 18:12
Quantum Series Blue Line product update:
QUANTUM-PRO: The New Standard for Fast Scanning Applications Download full spec sheet
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