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AFM Nanometrology Of Hard Sapphire Micro-bumps With Excellent Repeatability

Posted 20-09-30 19:02 | Permalink:
Publication update:
nanotools tilt-corrected M-CIS probes with 400 nm length and 4˚ half cone angle featured in research article

Discover how very durable nanotools M-CIS are applied to measure height, diameters, pitch, and side angles of Patterned Sapphire Substrate. 
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