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Atomic Resolution Quality Control for Fin Oxide Recess

Posted 16-09-30 16:39 | Permalink:
TransTech_Pub Publication update:
nanotools M-CNT-100 tips in research article

Discover how nanotools M-CNT-100 tips enable to gain insight into oxide recess uniformity in FinFET devices
Visit Scientific.Net for details (external link)

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