Blue Line product flyer update:
EBD-RTESPA™: General purpose carbon probe of unrivaled lifetime

• Controlled radius:
  Precisely controlled radius 7 nm (< 10 nm)
• Controlled shape:
  For step height, roughness and AFM profiling
• Optimized cantilevers:
  Standard with k: 40 N/m, f: 320 KHz
  Available as EBD-FESPA with k: 2.8 N/m, f: 75 KHz
  Available for force-controlling scanning modes with k: 0.4 N/m, f: 60 KHz
• Diamond-like hardness and durability:
  Exceptional wear resistance of diamond-like carbon for consistent
  performance and reduced cost per measurement
• Delivered with TrueDimensions:
  Datasheet for every single probe available online 24/7 via QR code

Download full spec sheet
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Blue Line product update:
MCNT-500™: The original amorphous CNT solution for demanding depth metrology applications

• Controlled orientation: 3° or 12°:
  Tilt compensation within ±0.5° for enhanced access capabilities to bottom trench features
• Controlled shape:
  Precisely controlled length of 500 nm and uniform width of 30 nm
• Optimized cantilevers:
  Standard with k: 40 N/m, f: 320 KHz
  Softer cantilevers for force-controlling scanning modes available upon request
• Diamond-like hardness and durability:
  Exceptional wear resistance of diamond-like carbon for consistent
  performance and reduced cost per measurement
• Delivered with TrueDimensions:
  Datasheet for every single probe available online 24/7 via QR code

Download full spec sheet
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Green Line product update:
biotool high-res:  carbon AFM probe for minimal tip-sample interactions and long-lasting performance

• Super sharp tip apex:
  Radius r: 2 nm
• Soft quartz cantilevers:
  Spring constant k: 0.1 N/m, Frequency f: 50 Hz
• Diamond-like carbon material:
  Hydrophobic
  Resistant against acids, basics, salt solutions and organic solvents
  Long lasting, non-brittle
  Extreme low tip degradation
• Gold reflex coating
  

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Publication update:
nanotools spherical AFM tips featured in research article

Discover how nanotools biosphere™ with controlled 150 nm spherical tip is applied to demonstrate the importance of precise tip geometry for plasmon-enhanced spectroscopies.

• Title: Understanding the plasmonics of nanostructured atomic force microscopy tips
  DOI: 10.1063/1.4964601
• Authors: A. Sanders, R. W. Bowman, L. Zhang, V. Turek, D. O. Sigle, A. Lombardi, L. Weller, and J. J. Baumberg
• Publication: Applied Physics Letters
• Publisher: AIP Publishing
• Date: 10 October 2016

-> Visit Applied Physics Letters for details (external link)
Reproduced from Appl. Phys. Lett. 109, 153110 (2016),
with the permission of AIP Publishing.

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Green Line product update:
biotool cell XXL:  carbon AFM probe for live cell imaging and dynamic processes

• 15 µm long tip: extra-long, conically shaped and tilt compensated.
• 25 nm tip radius: precisely fabricated gentle apex.
• Soft quartz cantilevers: Spring constant k: 0.1 N/m, Frequency f: 50 Hz.
• Diamond-like carbon material:
  Hydrophobic
  Resistant against acids, basics, salt solutions and organic solvents
  Long lasting, non-brittle
  Extreme low tip degradation
• Reflective coating: Gold reflex.

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Publication update:
nanotools spherical AFM tips featured in research article

Discover how nanotools biosphere ^TM with precise 50 nm spherical tip deposited on 0.2 N/m cantilevers is applied for imaging hydrogel samples to identify the formation of collagen fibrils during the fabrication process.

• Title: A tissue-mimetic nano-fibrillar hybrid injectable hydrogel for potential soft tissue engineering applications.
  DOI: 10.1038/s41598-017-18523-3
• Authors: Neda Latifi, Meisam Asgari, Hojatollah Vali, Luc Mongeau, McGill University Montreal (Canada)
• Publication: Scientific Reports
• Publisher: Springer Nature
• Date: 18 January 2018

Visit Scientific Reports for details (external link)

Distributed under Creative Commons Attribution 4.0 International License.
Copyright © 2018 The Author(s).

Green Line product update:
biosphere™:  carbon AFM probes for nanoindentation and nanomechanical mapping

• Controlled tip radius: precisely fabricated spherical tips, available with 12 different radii: 20 nm - 2 µm.
  Every single tip radius extracted from NIST-traceable Hi-Res SEM measurements.
• Pre-calibrated cantilevers: individually pre-calibrated cantilever spring constant using Laser Doppler Vibrometer.
  k: 200 N/m - 0.2 N/m (other k available)
• Diamond-like hardness and durability: HDC/DLC sphere hardness (Young’s Modulus ≥ 800 GPa) for repeatable and long lasting deformation measurements and nanomechanical studies.
• Au reflex coating: other coatings available.
• Provided with TrueDimensions: 24/7 online availability of individual probe parameters.

Download full spec sheet
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Publication update:
nanotools spherical and high resolution AFM tips featured in research article

Discover how nanotools biosphere™ is applied to estimate the elastic modulus of cylindrical micellar filaments using force volume analysis, and biotool high resolution was used for imaging spherical micelles and micellar filaments.

• Title: Micro-mechanical, continuum-mechanical, and AFM-based descriptions of elasticity in open cylindrical micellar filaments, DOI: 10.1039/c7sm00911a
• Authors: Meisam Asgari, McGill University (Canada)
• Publication: Soft Matter
• Publisher: The Royal Society of Chemistry
• Date: August 2017

Visit The Royal Society of Chemistry for details (external link)

Used with permission from The Royal Society of Chemistry (LICENSE #: 4196420972218).
Copyright © 2017 The Royal Society of Chemistry. All rights reserved.

Conference proceedings update:
In-line AFM measurement of erosion and dishing behaviors at different CMP conditions

Experience how nanotools MCNT-100™ AFM tips are successfully applied to accurately extract demanding local height variations with long term reliability.

• Conference: International Conference on Planarization/CMP Technology, Katholieke Universiteit Leuven, Leuven, Belgium
• Session D: Equipment, CMP Fundamentals
• Date: Wednesday, October 11, 2017, 3:40 PM
• Title: In-line Atomic Resolution Local Nanotopography Variation Metrology for CMP Process
• Speaker (invited): Tae-Gon Kim, imec (Belgium)

Visit the ICPT 2017 conference page for details (external link)

Copyright © 2017 by VDE.

Publication update:
nanotools spherical AFM tips featured in conference proceedings

Learn how the stiffness of sputtered Au on polydimethylsiloxane as a function of Au layer thickness is extracted by using spherical full carbon AFM tips with 500 nm radius.

• Title: Morphology and conductivity of Au films on polydimethylsiloxane using (3-mercaptopropyl)trimethoxysilane (MPTMS) as adhesion promoter
  DOI: 10.1117/12.2219199
• Authors: Bekim Osmani, Hans Deyhle, Florian M. Weiss, Tino Töpper, Maria Karapetkova, Vanessa Leung, Bert Müller, University of Basel (Switzerland)
• Publication: SPIE Proceedings
• Publisher: SPIE
• Date: April 2016

Visit SPIE Digital Library for details (external link)

Used with kind permission from Bekim Osmani and SPIE.
Copyright © 2016 SPIE. All rights reserved.