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Four-axes stage for low-noise AFM CD measurements

Posted 20-02-12 18:09 | Permalink:
Publication update:
nanotools CDR30-EBD and HAR probes featured in research article

Discover how nanotools CDR30-EBD and High Aspect Ratio (HAR) probes are applied to study tip wear, repeatability and reproducibility of CD measurements.
Visit Ultramicroscopy for details (external link)
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