EBD-16: Semi Fab proven solution for extreme deep trench metrology
Posted 21-06-30 07:09
Blue Line product flyer update:EBD-16™: World's longest high-performance AFM tip.
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Optimized conical shape for enhanced stability
Precisely controlled DLC spike length > 16 µm (Total tip length > 26 µm) -
Controlled orientation: 12°, 13° or 3°
Tilt compensation for enhanced access to bottom trench features -
Diamond-like hardness and durability
Unmatched wear resistance for consistent depth data, enhanced throughput, and reduced cost per measurement -
Optimized cantilevers
Standard with k: 40 N/m, f: 320 kHz. Softer cantilevers available. - Delivered with TrueDimensions™
Datasheet for every single probe available online 24/7 via QR code
Flat Tip Effectively Avoids Tip-derived Youngs Modulus Errors Introduced by Conventional Tips
Posted 21-05-31 23:14
Publication update:
nanotools custom-made Flat Tip featured in research article
Discover how nanotools Flat Tip with precisely controlled indentation area is applied to effectively measure Young's modulus of a whole yeast cell.
- Title: Evaluating Young's Modulus of Single Yeast Cells Based on Compression Using an Atomic Force Microscope with a Flat Tip
DOI: 10.1017/S1431927620024903 - Authors: Di Chang, Takahiro Hirate, Chihiro Uehara, Hisataka Maruyama, Nobuyuki Uozumi, Fumihito Arai
- Publication: Microscopy and Microanalysis
- Publisher: Cambridge University Press
- Date: Jan 15, 2021
Copyright © The Author(s), 2021. Published by Cambridge University Press
Influence of AFM Tip Radius when Measuring Mechanical Properties of Biomimetic Membranes
Posted 21-04-30 04:54
Publication update:
nanotools biosphere™ probes featured in research article
Discover how nanotools hydrophobic and chemical resistant biosphere™ with precisely controlled 20 and 50 nm radius and pre-calibrated cantilevers are applied to study the mechanical properties of supported lipid bilayers.
- Title: Compression, Rupture, and Puncture of Model Membranes at the Molecular Scale
DOI: 10.1021/acs.langmuir.0c00247 - Authors: Oscar Saavedra V., Thales F. D. Fernandes, Pierre-Emmanuel Milhiet, and Luca Costa
- Publication: Langmuir
- Publisher: American Chemical Society
- Date: June 1, 2020
Copyright © 2020 American Chemical Society
Van der Waals heterojunctions create new platform for photovoltaic and photodetector design
Posted 21-03-31 20:38
Publication update:
nanotools SuperSharpStandard-NCHR probes featured in research article
Discover how nanotools SuperSharpStandard-NCHR with 2-3 nm radius was applied to determine surface morphology and thickness of MoS2 layers.
- Title: Characteristics of a type-II n-MoS2/p-Ge van der Waals heterojunction
DOI: 10.1016/j.cap.2020.03.018 - Authors: Donghwan Kim, ChaeHo Shin, Joo Hyung Park, Jonghoo Park, TaeWan Kim
- Publication: Current Applied Physics
- Publisher: Elsevier
- Date: June 2020
© 2020 Korean Physical Society. Published by Elsevier B.V. All rights reserved.
Studying Plant Cell Wall Stiffness Gradients Using AFM Nano-Indentation
Posted 21-02-28 23:24
Publication update:
nanotools biosphere™, biotool hi-res, and SSS-FMR featured in research article
Discover how nanotools biosphere™ with 100 nm radius, biotool hi-res, and SSS-FMR with 2-3 nm radius and are applied for imaging and force spectroscopy.
- Title: Nano-indentation reveals a potential role for gradients of cell wall stiffness in directional movement of the resurrection plant Selaginella lepidophylla
DOI: 10.1038/s41598-019-57365-z - Authors: Meisam Asgari, Véronique Brulé, Tamara L. Western, Damiano Pasini
- Publication: Scientific Reports
- Publisher: Springer Nature
- Date: January 16, 2020
Distributed under Creative Commons Attribution 4.0 International License.
Copyright © 2020 The Author(s).
EBD8-600A: Semi fab metrology workhorse for extreme HAR trench profiling
Posted 21-01-31 08:44
Blue Line product flyer update:EBD8-600A: High performance replacement for FIB silicon AFM tips.
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Optimized conical shape for enhanced stability
AR > 10: precisely controlled length up to 8 µm and tightly controlled diameters at 1 and 5 µm from apex -
Diamond-like hardness and durability
Exceptional wear resistance for consistent depth data, enhanced throughput, and reduced cost per measurement -
Controlled orientation: 12° or 3°
Tilt compensation for enhanced access to bottom trench features -
Optimized cantilevers
Standard with k: 40 N/m, f: 320 KHz. Softer cantilevers available. - Delivered with TrueDimensions™
Datasheet for every single probe available online 24/7 via QR code
Large-Area Graphene Oxide Films for Supercapacitor Electrodes, Transparent Conductive Films and FET's
Posted 20-11-30 18:13
Publication update:
nanotools EBD-HAR probes featured in research article
Discover how nanotools EBD-HAR is applied to determine the thickness and roughness of graphene oxide films.
- Title: Formation of graphene oxide films at the liquid/liquid Interface
DOI: 10.1080/15685543.2014.918789 - Authors: Jing Xin, Beibei Xie, Ya Li, Juanjuan Shang, Yujiao Qiu, Libing Liu, Shaofu Zhao, Lidan Fan, and Renjie Zhang
- Publication: Composite Interfaces
- Publisher: Taylor & Francis
- Date: January 26, 2014
Copyright © 2014 Taylor & Francis
Engineering Mechanical Properties Of Metal-Organic Materials
Posted 20-10-26 23:00
Publication update:
nanotools biosphere™ probes featured in research article
Discover how nanotools hydrophobic and chemical resistant biosphere™ with 50 nm radius is applied for nanoindentation of MPN films enabling reduction of adhesion issues between tip and films.
- Title: Tuning the Mechanical Behavior of Metal-Phenolic Networks through Building Block Composition
DOI: 10.1021/acsami.8b19988 - Authors: Gyeongwon Yun, Joseph J. Richardson, Matthew Biviano, and Frank Caruso
- Publication: ACS Applied Materials & Interfaces
- Publisher: ACS - American Chemical Society
- Date: February 5, 2019
Copyright © 2019 American Chemical Society
AFM Nanometrology Of Hard Sapphire Micro-bumps With Excellent Repeatability
Posted 20-09-30 19:02
Publication update:
nanotools tilt-corrected M-CIS probes with 400 nm length and 4˚ half cone angle featured in research article
Discover how very durable nanotools M-CIS are applied to measure height, diameters, pitch, and side angles of Patterned Sapphire Substrate.
- Title: Automatic Patterned Sapphire Substrate Nanometrology Using Atomic Force Microscope
DOI: 10.1109/TNANO.2015.2392128 - Authors: Shao-Kang Hung; Chiao-Hua Cheng, and Cheng-Lung Chen
- Publication: IEEE Transactions on Nanotechnology
- Publisher: IEEE
- Date: January 2015
Copyright © 2015, IEEE
Comparing 5 topography sensors in a single set-up. How does AFM measure up?
Posted 20-08-24 22:17
Publication update:
nanotools tilt-corrected EBD-HAR probes with 800 nm length and 4˚ half cone angle featured in research article
Discover how nanotools EBD-HAR are applied to resolve steep edges and fine surface structures.
- Title: Sensor characterization by comparative measurements using a multi-sensor measuring system
DOI: 10.5194/jsss-8-111-2019 - Authors: Sebastian Hagemeier, Markus Schake, and Peter Lehmann
- Publication: Journal of Sensors and Sensor Systems
- Publisher: Copernicus Publications
- Date: February 2019
© Author(s) 2019. Distributed under the Creative Commons Attribution 4.0 License.
All rights reserved.
All rights reserved.
