EBD8-600A: Semi fab metrology workhorse for extreme HAR trench profiling
Posted 21-01-31 08:44
Blue Line product flyer update:EBD8-600A: High performance replacement for FIB silicon AFM tips.
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Optimized conical shape for enhanced stability
AR > 10: precisely controlled length up to 8 µm and tightly controlled diameters at 1 and 5 µm from apex -
Diamond-like hardness and durability
Exceptional wear resistance for consistent depth data, enhanced throughput, and reduced cost per measurement -
Controlled orientation: 12° or 3°
Tilt compensation for enhanced access to bottom trench features -
Optimized cantilevers
Standard with k: 40 N/m, f: 320 KHz. Softer cantilevers available. - Delivered with TrueDimensions™
Datasheet for every single probe available online 24/7 via QR code
Large-Area Graphene Oxide Films for Supercapacitor Electrodes, Transparent Conductive Films and FET's
Posted 20-11-30 18:13
Publication update:
nanotools EBD-HAR probes featured in research article
Discover how nanotools EBD-HAR is applied to determine the thickness and roughness of graphene oxide films.
- Title: Formation of graphene oxide films at the liquid/liquid Interface
DOI: 10.1080/15685543.2014.918789 - Authors: Jing Xin, Beibei Xie, Ya Li, Juanjuan Shang, Yujiao Qiu, Libing Liu, Shaofu Zhao, Lidan Fan, and Renjie Zhang
- Publication: Composite Interfaces
- Publisher: Taylor & Francis
- Date: January 26, 2014
Copyright © 2014 Taylor & Francis
Engineering Mechanical Properties Of Metal-Organic Materials
Posted 20-10-26 23:00
Publication update:
nanotools biosphere™ probes featured in research article
Discover how nanotools hydrophobic and chemical resistant biosphere™ with 50 nm radius is applied for nanoindentation of MPN films enabling reduction of adhesion issues between tip and films.
- Title: Tuning the Mechanical Behavior of Metal-Phenolic Networks through Building Block Composition
DOI: 10.1021/acsami.8b19988 - Authors: Gyeongwon Yun, Joseph J. Richardson, Matthew Biviano, and Frank Caruso
- Publication: ACS Applied Materials & Interfaces
- Publisher: ACS - American Chemical Society
- Date: February 5, 2019
Copyright © 2019 American Chemical Society
AFM Nanometrology Of Hard Sapphire Micro-bumps With Excellent Repeatability
Posted 20-09-30 19:02
Publication update:
nanotools tilt-corrected M-CIS probes with 400 nm length and 4˚ half cone angle featured in research article
Discover how very durable nanotools M-CIS are applied to measure height, diameters, pitch, and side angles of Patterned Sapphire Substrate.
- Title: Automatic Patterned Sapphire Substrate Nanometrology Using Atomic Force Microscope
DOI: 10.1109/TNANO.2015.2392128 - Authors: Shao-Kang Hung; Chiao-Hua Cheng, and Cheng-Lung Chen
- Publication: IEEE Transactions on Nanotechnology
- Publisher: IEEE
- Date: January 2015
Copyright © 2015, IEEE
Comparing 5 topography sensors in a single set-up. How does AFM measure up?
Posted 20-08-24 22:17
Publication update:
nanotools tilt-corrected EBD-HAR probes with 800 nm length and 4˚ half cone angle featured in research article
Discover how nanotools EBD-HAR are applied to resolve steep edges and fine surface structures.
- Title: Sensor characterization by comparative measurements using a multi-sensor measuring system
DOI: 10.5194/jsss-8-111-2019 - Authors: Sebastian Hagemeier, Markus Schake, and Peter Lehmann
- Publication: Journal of Sensors and Sensor Systems
- Publisher: Copernicus Publications
- Date: February 2019
© Author(s) 2019. Distributed under the Creative Commons Attribution 4.0 License.
All rights reserved.
All rights reserved.
Tailoring Elastic Modulus of PDMS Nano-Membranes for Bioelectronic Applications
Posted 20-07-15 03:34
Publication update:
nanotools biosphere™ probes featured in research article
Discover how nanotools biosphere™ with precisely controlled 500 nm radius and pre-calibrated cantilevers is applied to study the mechanical properties of PDMS films.
- Title: Polydimethylsiloxane films engineered for smart nanostructures
DOI: 10.1016/j.mee.2018.02.029 - Authors: Tino Töpper, Bekim Osmani, Bert Müller
- Publication: Microelectronic Engineering
- Publisher: Elsevier
- Date: November 2018
© 2018 Elsevier Ltd. All rights reserved.
Studying nanomechanical properties of primary cell walls in the inner tissues of growing plant organs
Posted 20-06-19 09:21
Publication update:
nanotools biosphere™ probes featured in research article
Discover how nanotools biosphere™ with precisely controlled 100 nm radius and pre-calibrated cantilevers is applied for imaging and nanoindentation of plant cell walls.
- Title: Assessment of Primary Cell Wall Nanomechanical Properties in Internal Cells of Non-Fixed Maize Roots
DOI: 10.3390/plants8060172 - Authors: Liudmila Kozlova, Anna Petrova, Boris Ananchenko and Tatyana Gorshkova
- Publication: Plants
- Publisher: MDPI
- Date: June 2019
© 2019 MDPI. All rights reserved.
NIST scientists study CD-AFM tip lifetime and wear rate: impact on measurement variability and cost
Posted 20-04-10 00:06
Publication update:
nanotools CDR50-EBD probes used in study published by NIST researchers
Discover how the wear behavior of nanotools CDR50-EBD with controlled 50 nm diameter compare to that of standard CDR silicon probes.
- Title: Wear comparison of critical dimension-atomic force microscopy tips
DOI: 10.1117/1.JMM.19.1.014004 - Authors: Ndubuisi G. Orji, Ronald G. Dixson, Ernesto Lopez, Bernd Irmer
- Publication: Journal of Micro/Nanolithography, MEMS, and MOEMS
- Publisher: SPIE - Intl. Society for Optical Engineering
- Date: March 28, 2020
© 2020 SPIE - Intl. Society for Optical Engineering. All rights reserved.
Connecting with partners and peers at the SPIE Advanced Lithography
Posted 20-02-20 07:07
Event update:
nanotools is attending the SPIE Advanced Lithography in California.
The technical program of the primary global lithography event will focus
on works in optical lithography, metrology, and EUV.
If you would like to meet us, please click here.
We are looking forward to seeing you in San Jose!
If you have not registered yet, please click here to do so.
Four-axes stage for low-noise AFM CD measurements
Posted 20-02-12 18:09
Publication update:
nanotools CDR30-EBD and HAR probes featured in research article
Discover how nanotools CDR30-EBD and High Aspect Ratio (HAR) probes are applied to study tip wear, repeatability and reproducibility of CD measurements.
- Title: A position-controllable external stage for critical dimension measurements via low-noise atomic force microscopy
DOI: 10.1016/j.ultramic.2018.07.005 - Authors: Moon, Seunghyun, Kim, Jung-Hwan, Kim, Ju-Hwang, Kim, Youn Sang, Shin, ChaeHo
- Publication: Ultramicroscopy
- Publisher: Elsevier
- Date: November 2018
© 2018 Elsevier Ltd. All rights reserved.
