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Van der Waals heterojunctions create new platform for photovoltaic and photodetector design

Posted 21-03-31 20:38
nanotools_SSS-NCHR
Publication update:
nanotools SuperSharpStandard-NCHR probes featured in research article

Discover how nanotools SuperSharpStandard-NCHR with 2-3 nm radius was applied to determine surface morphology and thickness of MoS2 layers.
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© 2020 Korean Physical Society. Published by Elsevier B.V. All rights reserved.

Studying Plant Cell Wall Stiffness Gradients Using AFM Nano-Indentation

Posted 21-02-28 23:24
nanotools_nature_biosphere_biotool
Publication update:
nanotools biosphere™, biotool hi-res, and SSS-FMR featured in research article

Discover how nanotools biosphere™ with 100 nm radius, biotool hi-res, and SSS-FMR with 2-3 nm radius and are applied for imaging and force spectroscopy.
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Distributed under Creative Commons Attribution 4.0 International License.
Copyright © 2020 The Author(s).

EBD8-600A: Semi fab metrology workhorse for extreme HAR trench profiling

Posted 21-01-31 08:44
nanotools_EBD8-600A Blue Line product flyer update:
EBD8-600A: High performance replacement for FIB silicon AFM tips.
Download EBD8-600A product flyer
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Large-Area Graphene Oxide Films for Supercapacitor Electrodes, Transparent Conductive Films and FET's

Posted 20-11-30 18:13
nanotools_EBD-HAR
Publication update:
nanotools EBD-HAR probes featured in research article

Discover how nanotools EBD-HAR is applied to determine the thickness and roughness of graphene oxide films.
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Copyright © 2014 Taylor & Francis

Engineering Mechanical Properties Of Metal-Organic Materials

Posted 20-10-26 23:00
biosphere_B50
Publication update:
nanotools biosphere™ probes featured in research article

Discover how nanotools hydrophobic and chemical resistant biosphere™ with 50 nm radius is applied for nanoindentation of MPN films enabling reduction of adhesion issues between tip and films.
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Copyright © 2019 American Chemical Society

AFM Nanometrology Of Hard Sapphire Micro-bumps With Excellent Repeatability

Posted 20-09-30 19:02
nanotools_M-CIS
Publication update:
nanotools tilt-corrected M-CIS probes with 400 nm length and 4˚ half cone angle featured in research article

Discover how very durable nanotools M-CIS are applied to measure height, diameters, pitch, and side angles of Patterned Sapphire Substrate. 
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Copyright © 2015, IEEE

Comparing 5 topography sensors in a single set-up. How does AFM measure up?

Posted 20-08-24 22:17
nanotools_EBD-HAR
Publication update:
nanotools tilt-corrected EBD-HAR probes with 800 nm length and 4˚ half cone angle featured in research article

Discover how nanotools EBD-HAR are applied to resolve steep edges and fine surface structures.
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© Author(s) 2019. Distributed under the Creative Commons Attribution 4.0 License.
All rights reserved.

Tailoring Elastic Modulus of PDMS Nano-Membranes for Bioelectronic Applications

Posted 20-07-15 03:34
biosphere_B500
Publication update:
nanotools biosphere™ probes featured in research article

Discover how nanotools  biosphere™ with precisely controlled 500 nm radius and pre-calibrated cantilevers is applied to study the mechanical properties of PDMS films.
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© 2018 Elsevier Ltd. All rights reserved.

Studying nanomechanical properties of primary cell walls in the inner tissues of growing plant organs

Posted 20-06-19 09:21
biosphere_B100
Publication update:
nanotools biosphere™ probes featured in research article

Discover how nanotools  biosphere™ with precisely controlled 100 nm radius and pre-calibrated cantilevers is applied for imaging and nanoindentation of plant cell walls.
Visit Plants for details (external link)
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© 2019 MDPI. All rights reserved.

NIST scientists study CD-AFM tip lifetime and wear rate: impact on measurement variability and cost

Posted 20-04-10 00:06
CDR50-EBD
Publication update:
nanotools CDR50-EBD probes used in study published by NIST researchers

Discover how the wear behavior of nanotools CDR50-EBD with controlled 50 nm diameter compare to that of standard CDR silicon probes.
Download paper from NIST website - Local Download (external link)

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© 2020 SPIE - Intl. Society for Optical Engineering. All rights reserved.

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