The option to choose from a large variety of cantilevers combined with the nanofabrication of high density diamond-like carbon SPM probes based on electron beam induced processing offers exceptional flexibility and customisability. This approach enables us to fabricate personalised SPM probes, which truly meet your technical requirements: combine cantilever, tip shape, tip orientation and tip coating according to your individual needs or contact us for any further probe designs.
100% ultrahigh resolution SEM quality check for every tip available. Certified quality management system according to ISO 9001.
- Beam or triangle shape
- Made of Si or SiN with or without chip alignments
- Force constants from 0.2 N/m to 42 N/m at resonance frequencies between 13 kHz and 340 kHz
- Apply your own cantilevers
- Conical (AR 3 - 9), post-like (AR 10 - 20) or spherical shape
- Length and diameter/tip width at 2/3 tip length/spherical radius
- Tip apex sharpness
Tip orientation options:
- Side view tip orientation from -45° to +45°
- Front view tip orientation from -45° to +45°
- Precision of orientation from ±1.0° to ±0.5°
- Tip coating
- Backside coating
- Reflex coating
- Coating material
- Coating thickness
Didn't find what you were looking for? Please do not hesitate to contact us for any further tip design and specification. We will create your personal tip of almost any desired geometry and functionality.