NanoIndentation
Controlled radius, pre-calibrated cantilevers: spherical AFM tips for high performance nanoindentation measurements
- Spherical tip geometry for reliable nanomechanical investigations and advanced modelling
- Controlled tip shape radii from 20 nm (±5 nm) to 2000 nm (±10 nm) for the most accurate data fitting
- Pre-calibrated force constants from 0.2 N/m to 40 N/m* suitable for a wide range of sample stiffness
- Outstanding HDC/DLC tip hardness for repeatable and long-lasting deformation measurements