SuperSharp Probe For Very Fine Features. High Resolution Imaging With Long Lifetime And Imaging Stability.
2 nm tip radius, high resolution probe with excellent lifetime and reliability. The nanotools® SSE - SuperSharp Enhanced is designed for non-contact / high frequency mode. It delivers outstanding resolution and image stability in critical AFM applications even on hard, tip eating samples like ceramics, silicon oxide/nitride, polysilicon to name a few.
|Sketch Tip Spec|
|Tip radius (r)||2-3 nm||< 5 nm|
||13 deg||+/- 1 deg|
|Pyramide height (PH)
||15 µm||10-15 µm|
|Tip set back (TSB)
||15 µm||5-25 µm|
|Sketch Cantilever Spec
|Type||TESPA / NCHR|
|Force Const.||42 N/m||20-75 N/m|
|Res. Frequency||320 kHz||270-350 kHz|
||125 µm||115-135 µm|
||30 µm||22-38 µm|
||4 µm||3-5 µm|
Tip side: none
Back side: 30 nm Al reflex
We do a 100% SEM quality check for every tip (datasheet with precise tip dimensions provided). Every tip is handled in an ESD closed circle, clean room packed and vacuum sealed for shipment.
nanotools is the first and only probe manufacturer being quality certified to DIN EN ISO 9001.
The high aspect ratio part of the probe is made from High Density, diamond like carbon (HDC/DLC).
The tips show superior properties:
high aspect ratio
hydrophobic surface properties
high stiffness / elastic modulus (8x of that of silicon)
low thermal mass
Our HDC dissipates static charge. This leads to probes offering the extreme durability of diamond together with high resolution imaging capability. Applying our patented EBD technique we ensure a stiff and rigid high aspect ratio probe of superior symmetry and nanometer precision.