MSS_PatternedMedia

MSS_PatternedMedia


SUPRA Lifetime probe on FMR

Ordercode: MSS_FMR_3

Due to the softer FMR cantilever this multipurpose high resolution probe approaches ultimative lifetime and reliability. The special qualities of our MSS PatternedMedia also lead to the best interaction between tip and cantilever.
The nanotools® MSS_FMR_3 tip is designed for non-contact / high frequency mode. It delivers outstanding resolution in critical AFM applications even on hard, tip eating samples like ceramics, silicon oxide/nitride or polysilicon to name a few. 

Tip Spec

Skizze Tip Spec

Sketch Tip Spec

nominal range
Shape conical
Tip length (l) 400 nm +/- 100 nm
Tip radius (r) 2-3 nm < 5 nm
Tip diameter (d) measured at 300 nm
30 nm
+/- 10 nm
Tilt compensation
3 deg +/- 0.5 deg
Pyramide height (PH)
15 µm 10-15 µm
Tip set back (TSB)
15 µm 5-25 µm

Cantilever Spec

Skizze Cantilever Spec

Sketch Cantilever Spec

nominal range
Type FMR
Shape beam
Force Const. 2.8 N/m 0.5-9.5 N/m
Res. Frequency 75 kHz 45-115 kHz
Length (l)
225 µm 215-235 µm
Width (w)
28 µm 20-35 µm
Thickness (t)
3 µm 2-4 µm

Coating

Tip side: none
Back side: reflex


Certified Quality

We do a 100% SEM quality check for every tip (datasheet with precise tip dimensions provided). Every tip is handled in an ESD closed circle, clean room packed and vacuum sealed for shipment.

nanotools is the first and only probe manufacturer being quality certified to DIN EN ISO 9001.

 

EBD

The high aspect ratio part of the probe is made from High Density, diamond like carbon (HDC/DLC).

The tips show superior properties:

  • high aspect ratio

  • hydrophobic surface properties

  • high stiffness / elastic modulus (8x of that of silicon)

  • low thermal mass

  • abrasion resistance

Our HDC dissipates static charge. This leads to probes offering the extreme durability of diamond together with high resolution imaging capability. Applying our patented EBD technique we ensure a stiff and rigid high aspect ratio probe of superior symmetry and nanometer precision.