M1_ArrowNC_13 for Veeco Vx
Multipurpose High Aspect Ratio EBD Probe
M1_ArrowNC_13 tip is designed for
non-contact / high frequency mode, in particular for
automated AFM systems for in-line process control as
well as general purpose AFM. Excellent lifetime and
reliability for high aspect ratio applications are key features.
|Sketch Tip Spec|
|Tip length (l)||800 nm||+/- 200 nm|
|Tip radius (r)||< 5 nm||< 10 nm|
|Tip diameter (d) measured at 600 nm
||+/- 10 nm|
||13 deg||+/- 1 deg|
|Pyramide height (PH)
||15 µm||10-15 µm|
|Tip set back (TSB)
||5.2 µm||4-5.5 µm|
|Sketch Cantilever Spec
|Force Const.||42 N/m||27-80 N/m|
|Res. Frequency||285 kHz||240-380 kHz|
||160 µm||150-170 µm|
||45 µm||37.5-52.5 µm|
||4 µm||3-5 µm|
Tip side: none
Back side: none
We do a 100% SEM quality check for every tip (datasheet with precise tip dimensions provided). Every tip is handled in an ESD closed circle, clean room packed and vacuum sealed for shipment.
nanotools is the first and only probe manufacturer being quality certified to DIN EN ISO 9001.
Our M1 is used by leading fabs worldwide for several AFM in-line monitoring tasks such as depth control or STI.
The high aspect ratio part of the probe is made from High Density, diamond like carbon (HDC/DLC).
The tips show superior properties:
high aspect ratio
hydrophobic surface properties
high stiffness / elastic modulus (8x of that of silicon)
low thermal mass
Our HDC dissipates static charge. This leads to probes offering the extreme durability of diamond together with high resolution imaging capability. Applying our patented EBD technique we ensure a stiff and rigid high aspect ratio probe of superior symmetry and nanometer precision.